◎Research Areas micro-nano optical computing measurement, polarized light imaging, high temperature superconductor physical properties research, intelligent photoelectric sensing technology. ◎Education 2019.09–2025.06: Ph.D. in Optical Engineering (Direct Ph.D. track), Shandong University 2015.09–2019.06: B.E. in Electronic Science and Technology, Shandong University ◎Employment 2025.09-present: Lecturer, College of Control Science and Engineering, China University of Petroleum (East China) ◎Courses Offered ◎Guiding graduate students ◎Funding and Projects [1] 'Imaging spectroscopic ellipsometry of high-throughput superconducting composite films', preside. [2] 'High-throughput combination interface preparation and its electronic structure regulation', participated in. [3] 'Research on magnetic domain imaging theory and key technology of magnetic nano-film', participated in. [4] 'Study on the dielectric response mechanism of Mg1-xLixTi2O4 nanofilms',participated in. ◎Awards & Honors ◎Representative Publications [1] Wang Y, Sun W, Zhao M, et al. In-plane and out-of-plane anisotropy in the optical and dielectric properties of YBa2Cu3O7-x superconducting film, Applied Surface Science 673 (2024) 160896. [2] Wang Y, Wei M, Li Y, et al. Study of composition-modulated interband transitions characteristic and charge dynamics response of high-throughput FeSe1-xTex combinatorial film, Journal of Alloys and Compounds 1003 (2024) 175559. [3] Wang Y, Li Y, Wei M, et al. Composition-dependent optical, dielectric and d-orbital electron characteristic of high-throughput horizontal composition gradient Li1-xMgxTi2O4 combinatorial film, Journal of Alloys and Compounds 987 (2024) 174192. [4] Wang Y, Wei M, Han Y, Lian J. Study of in-plane optical anisotropy of two-dimensional ReS2 and ReSe2 based on imaging spectroscopic ellipsometry, Vacuum 233 (2025) 114026. [5] Wang Y, Lian J, Wei M, et al. Optical property and pseudogap study of FeSe thin films on different substrates, Optical Materials 131 (2022) 112727. [6] Wang Y, Lian J, Wei M, et al.Optical properties study of high-throughput horizontal composition gradient FeSe1-xTex thin film based on ellipsometry, Thin Solid Films 770 (2023) 139785. [7] Wang C, Wang Y, Gao Y, et al. Unraveling Tunable Optical Anisotropy in Colloidal Quantum Wells Using Mueller Matrix Ellipsometry, Journal of Physical Chemistry Letters 16 (2025) 100994. ◎Patent [1] Optical fiber refractive index measurement device, method and application based on ellipsometric imaging. [2] A sample stage for micro-area ellipsometry test of fiber refractive index. | 
